Surftest SJ-500/P – Series 178

Special Order

High precision and high performance type surface roughness tester with a dedicated control unit, achieving user-friendly display and simple operation
User-friendly display and simple operation equipped with a highly visible color 7.5-inch TFT LCD.
Easy positioning A joy stick built in the dedicated control unit allows easy and quick positioning. Fine positioning of a small stylus, required for measuring the inner side of a small hole, can be easily made using the manual knob.
Easy setting of measuring conditions for surface roughness. Equipped with simple input function allows inputs according to drawing instruction symbols of ISO/JIS roughness standards. Troublesome measuring condition settings can be easily input by directly selecting a drawing instruction symbol for surface roughness from the menu.

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Description

SKUModel No.Data Processing TypeX-Axis Meas. RangeVert. TravelGranite Base SizePC UnitDimensions (main unit)Assessed ProfilesEvaluation ParametersAnalysis GraphsCurved Surface CompensationContour AnalysisFiltersSpecial Order Item
178-533-02ASJ-500Dedicated Data Processor2in-50mmOptional StandOptional Stand13.7x10.4x3.4in/350x263x86mm16.7x3.7x6.3in 425x94x160mmDedicated data processor type: P (primary profile), R (roughness profile), WC, envelope residual profile, roughness motif,waviness motif PC system type: P (primary profile), R (roughness profile), WC, WCA, WE, WEA, DIN4776 profile, E (envelope residual profile),roughness motif, waviness motifDedicated data processor type: Ra, Rc, Ry, Rz, Rq, Rt, Rmax, Rp, Rv, R3z, Sm, S, Pc, mr (c),?c, mr, tp, Htp, Lo, lr, Ppi, HSC, ?a, ?q, Ku, Sk, Rpk, Rvk, Rk, Mr1, Mr2, A1, A2, Vo, ?a, ?q, R, AR, Rx, W, AW, Wx, Wte, (43 parameters), Customization PC system type: Pa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, P?q, Pmr (c), Pmr, P?c, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, R?q, Rmr (c), Rmr, R?c, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, W?q, Wmr (c), Wmr, W?c, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, lr, ?a, ?a, ?q, Vo, Htp, NR, NCRX, CPM, SR, SAR, NW, SW, SAWDedicated data processor type: ADC, BAC, power spectrum graph PC system type: ADC, BAC Graph, power spectrum graph, auto-correlation graph, Walsh power spectrum graph, Walsh autocorrelation graph, slope distribution graph, local peak distribution graph, parameter distribution graphDedicated data processor type: Parabolic compensation, Hyperbolic compensation, Elliptical compensation, Circular compensation Conic compensation, Inclination (Entire, Arbitrary) PC system type: Parabolic compensation, Hyperbolic compensation, Elliptical compensation, Circular compensation, Conic compensation, Inclination (Entire, Arbitrary), Polynomial compensationDedicated data processor type: Area, Circle, Angle, Coordinate difference, Step, Inclination PC system type (SURFPAK-EZ): Area, Circle, Angle, Coordinate difference, Step, InclinationDedicated data processor type: 2CR-75%, 2CRPC-75%, Gaussian, Robust-spline PC system type: 2CR-75%, 2CR-50%, 2CRPC-75%, 2CRPC-50%, Gaussian, Robust-splineInquire
178-531-02ASJ-500PPC SYSTEM2in-50mmOptional StandOptional Stand13.7x10.4x3.4in/350x263x86mm16.7x3.7x6.3in 425x94x160mmDedicated data processor type: P (primary profile), R (roughness profile), WC, envelope residual profile, roughness motif,waviness motif PC system type: P (primary profile), R (roughness profile), WC, WCA, WE, WEA, DIN4776 profile, E (envelope residual profile),roughness motif, waviness motifDedicated data processor type: Ra, Rc, Ry, Rz, Rq, Rt, Rmax, Rp, Rv, R3z, Sm, S, Pc, mr (c),?c, mr, tp, Htp, Lo, lr, Ppi, HSC, ?a, ?q, Ku, Sk, Rpk, Rvk, Rk, Mr1, Mr2, A1, A2, Vo, ?a, ?q, R, AR, Rx, W, AW, Wx, Wte, (43 parameters), Customization PC system type: Pa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, P?q, Pmr (c), Pmr, P?c, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, R?q, Rmr (c), Rmr, R?c, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, W?q, Wmr (c), Wmr, W?c, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, lr, ?a, ?a, ?q, Vo, Htp, NR, NCRX, CPM, SR, SAR, NW, SW, SAWDedicated data processor type: ADC, BAC, power spectrum graph PC system type: ADC, BAC Graph, power spectrum graph, auto-correlation graph, Walsh power spectrum graph, Walsh autocorrelation graph, slope distribution graph, local peak distribution graph, parameter distribution graphDedicated data processor type: Parabolic compensation, Hyperbolic compensation, Elliptical compensation, Circular compensation Conic compensation, Inclination (Entire, Arbitrary) PC system type: Parabolic compensation, Hyperbolic compensation, Elliptical compensation, Circular compensation, Conic compensation, Inclination (Entire, Arbitrary), Polynomial compensationDedicated data processor type: Area, Circle, Angle, Coordinate difference, Step, Inclination PC system type (SURFPAK-EZ): Area, Circle, Angle, Coordinate difference, Step, InclinationDedicated data processor type: 2CR-75%, 2CRPC-75%, Gaussian, Robust-spline PC system type: 2CR-75%, 2CR-50%, 2CRPC-75%, 2CRPC-50%, Gaussian, Robust-splineInquire

Features

High precision and high performance type surface roughness tester with a dedicated control unit, achieving user-friendly display and simple operation
User-friendly display and simple operation equipped with a highly visible color 7.5-inch TFT LCD.
Easy positioning A joy stick built in the dedicated control unit allows easy and quick positioning. Fine positioning of a small stylus, required for measuring the inner side of a small hole, can be easily made using the manual knob.
Easy setting of measuring conditions for surface roughness. Equipped with simple input function allows inputs according to drawing instruction symbols of ISO/JIS roughness standards. Troublesome measuring condition settings can be easily input by directly selecting a drawing instruction symbol for surface roughness from the menu.

Technical Data

X-axis (drive unit)
Measuring range: 1.97″ (50mm)
Resolution: 1.97µin(0.05µin)
Measurement method: Linear encoder
Drive speed:0 – 0.78″/s (0 – 20mm/s)
Measuring speed: 0.00078 – 0.2″/s (0.02 – 5mm/s)
Traversing direction: Pull
Traverse linearity: 0.0078µin/1.97″ (0.2µin/ 50mm)
Positioning: ±1.5° (tilting, with DAT function) 1.18″ (30mm) (up/down)

Detector

resolution / Range: 0.4µin/32000µin, 0.04µin/3200µin,
0.004µin/320µin
0.01µin(800µin), 0.001µin(80µin),
0.0001µin(8µin)
Detecting method: Skidless / skid measurement
Measuring force: 4mN or 0.75mN (low force type)
Stylus tip: Diamond, 90° / 5µin
(60° / 2µin: low force type)
Skid radius of curvature: 1.57″ (40mm)
Detecting method: Differential inductance

Control Unit

Display: 7.5″ color TFT with backlight
Printer: Built-in thermal printer
Magnification: Horizontal: X10 to X500,000, Auto
Vertical: X0.5 to X10,000, Auto
Drive unit control: Joystick operation with manual knob

Additional information

Weight N/A
Dimensions N/A
Model No.

SJ-500P, SJ-500

Data Processing

PC SYSTEM, Dedicated Data Processor

X-Axis Measuring Range

2in-50mm

Vertical Travel

Optional Stand

Granite Base Size

Optional Stand

PC Unit

13.7×10.4×3.4in/350x263x86mm

Dimensions

16.7×3.7×6.3in 425x94x160mm

Assessed Profiles

Dedicated data processor type: P (primary profile), R (roughness profile), WC, envelope residual profile, roughness motif,waviness motif

PC system type: P (primary profile), R (roughness profile), WC, WCA, WE, WEA, DIN4776 profile, E (envelope residual profile),roughness motif, waviness motif

Evaluation Parameters

Dedicated data processor type: Ra, Rc, Ry, Rz, Rq, Rt, Rmax, Rp, Rv, R3z, Sm, S, Pc, mr (c),?c, mr, tp, Htp, Lo, lr, Ppi, HSC,
?a, ?q, Ku, Sk, Rpk, Rvk, Rk, Mr1, Mr2, A1, A2, Vo, ?a, ?q, R, AR, Rx, W, AW, Wx, Wte,
(43 parameters), Customization

PC system type: Pa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, P?q, Pmr (c), Pmr, P?c, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, R?q,
Rmr (c), Rmr, R?c, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, W?q, Wmr (c), Wmr, W?c, Rk, Rpk, Rvk,
Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, lr, ?a, ?a, ?q, Vo, Htp, NR,
NCRX, CPM, SR, SAR, NW, SW, SAW

Analysis Graphs

Dedicated data processor type: ADC, BAC, power spectrum graph

PC system type: ADC, BAC Graph, power spectrum graph, auto-correlation graph, Walsh power spectrum graph, Walsh autocorrelation graph, slope distribution graph, local peak distribution graph, parameter distribution graph

Curved Surface Compensation

Dedicated data processor type: Parabolic compensation, Hyperbolic compensation, Elliptical compensation, Circular compensation
Conic compensation, Inclination (Entire, Arbitrary)

PC system type: Parabolic compensation, Hyperbolic compensation, Elliptical compensation, Circular compensation,
Conic compensation, Inclination (Entire, Arbitrary), Polynomial compensation

Contour Analysis

Dedicated data processor type: Area, Circle, Angle, Coordinate difference, Step, Inclination

PC system type (SURFPAK-EZ): Area, Circle, Angle, Coordinate difference, Step, Inclination

Filters

Dedicated data processor type: 2CR-75%, 2CRPC-75%, Gaussian, Robust-spline

PC system type: 2CR-75%, 2CR-50%, 2CRPC-75%, 2CRPC-50%, Gaussian, Robust-spline